High-Resolution Imaging

Kent Keyser, Ph.D. – Director

Contact: (205) 975-7225

Website: http://www.uab.edu/highresolutionimaging/


This Shared Facility’s mission is to provide state-of-the-art imaging resources and the technical support to use them effectively for Cancer Center investigators as well as other investigators in the UAB research community.

Facility Description

The High Resolution Imaging Facility or “HRIF” is a cutting-edge facility providing a variety of microscopy services for UAB Scientists.  Investigators conducting experiments that require the use of high end digital microscopes and technical expertise can benefit from the facility’s diverse resources.

Research Information

Fluorescence Microscopy, Confocal Laser Microscopy, Time Lapse, FRET, FRAP, Electron Microscopy, Cryo-EM Microscopy and Light Microscopy are available at the “HRIF.”  Consultation and training are available for all users of the facility by a staff of highly trained professionals.

Services and Fees

  • Surcharge for Assistance in Instrumentation or Sample Preparation
  • Basic Digital Imaging/Deconvolution/ Calcium Imaging — Olympus IX70
  • Basic Digital Imaging –Leitz Orthoplan, Nikon Diaphot
  • Confocal Laser Scanning Microscopy – Leica SP1
  • Confocal Laser Scanning Microscopy with UV Laser – Leica
  • Confocal Laser Scanning Microscopy — Olympus Fluoview
  • Digital Imaging/Timelapse/FRET/Histology Imaging – Nikon Eclipse
  • FRET/FRAP Confocal Laser Scanning Microscopy – Leica SP2
  • Large Specimen/Tissue Dissection Imaging Nikon Stereoscope
  • Data Archival Service Fee (includes blank CD)
    $3.00 each
  • High Resolution Printing: Inkjet
    $3.00 each
  • Transmission Electron Microscopy— FEI Tecnai T12 Spirit/Assisted
  • Transmission Electron Microscopy— FEI Tecnai T12 Spirit/Unassisted

Sample processing per sample/Bulk Discounts Available:

  • $75.00/Sample
  • Ultra-thin and semi-thin sectioning per sample with post stain
  • Negative Staining per Grid
  • Cryo-EM Usage Technai F20 Full Service Access
  • Cryo-EM Usage Technai F20 Full Service Access
  • Cryo-EM Usage Technai F20  Reduced Service Access
  • Cryo-EM Grid for Sample Preparation

Contact Information:

Director:  Kent Keyser, Ph.D.
Email:  ktkeyser@uab.edu
Phone: (205) 975-7225

Technical Staff:
Shawn Williams – Microscopist, Digital Imaging Specialist, Confocal Microscopy Specialist
Email:  tzaron@uab.edu
Phone:  (205) 934-7403

Ed Phillips – General Microscopy and Sample Preparation, Fluorescence, Histology, Electron Microscopy
Email:  dogfan@uab.edu
Phone:  (205) 934-7855

For questions pertaining to Electron Microscopy and EM Sample Preparation, please contact:

Melissa Chimento – Electron Microscopist – Transmission EM, Sample Preparation
Email:  mchimento@uab.edu
Phone:  (205) 934-1926

Terje Dokland, Ph.D. – Cryo-Electron Microscopist, Cryo-EM Sample Preparation
Email:  dokland@uab.edu
Phone:  (205) 996-4502 or (205) 996-4510

Website:  http://www.uab.edu/highresolutionimaging/

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